Optiwave OptiSystem 22.1
Optiwave announces OptiSystem 22.1, a major update to its optical system simulation platform, featuring advanced photonic integrated circuit (PIC) design/system characterization tools, machine learning capabilities, and workflow improvements. Optiwave OptiSystem 22.0 Tested Picture Key Highlights Optical S-Parameters: Import S-parameter files (including Touchstone) from OptiBPM, OptiFDTD, or third-party tools to model PICs in system-level simulations. Dynamically generates ports for seamless integration. PIC Waveguide (W.G): Model passive or electrically controlled optical waveguides with customizable refractive indices. Machine Learning Tool: Train systems using eye diagrams (internal or external) to predict performance and optimize parameters for optical networks. Workflow Enhancements Visualizers’ Quick View in project browser: Toggle between single-iteration or bundled data displays. VCSEL Laser Measured: Laser Linewidth Enhancement Factor now supports negative chirp...
