Tessent Silicon Lifecycle Management solutions include advanced debug, safety & security features and in-life data analytics to meet the evolving challenges of today’s silicon lifecycle.
Ensure the highest test quality, accelerate yield ramp and improve safety, security and reliability across the silicon lifecycle using best-in-class solutions for design-for-test (DFT), debug and in-life monitoring plus powerful data analytics.
Tessent Advanced DFT
Address the challenges of in-system test for today’s complex SoCs and chiplets with market-leading logic and memory test products that combine capabilities in a powerful test flow to ensure total chip coverage.
Tessent Embedded Analytics
Close productivity gaps using actionable insights from embedded analytics that shorten total development time, accelerate debug and reduce risk and cost to ensure timely market entry.
Tessent Yield Learning
Decrease time to yield, manage manufacturing excursions and recover yield caused by systematic defects. Set up yield learning solutions to identify systematic defects that cause low yield, saving time and costs.
Tessent Safety and Security
Access solutions that automate the application of safety and security technologies using Tessent to reduce risk and meet required standards and regulations.
